The evaluation system of the 2-D scanning mirror based on CMOS sensor

Gui-ying Zeng; Yuan Xie; Jin-xing Chen

doi:10.1117/12.865556

12 October 2010 The evaluation system of the 2-D scanning mirror based on CMOS sensor

Gui-ying Zeng, Yuan Xie, Jin-xing Chen

Proceedings Volume 7659, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Smart Structures and Materials in Manufacturing and Testing; 765915 (2010) https://doi.org/10.1117/12.865556
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

The high precision two-dimension scanning control technique is being developed for the next geosynchronous satellites FY-4 satellites which is using the three-axis stabilization stages. How to evaluate the point and scanning precision of the scanning mirror is one of the most important technologies. This paper describes the optoelectronic measure method based on CMOS sensors to evaluate the point and scanning precision of the scanning mirror in the laboratory, which is a 2-D dynamic angle measurement system. Some technologies, such as the sup-pixel orientation technology and the CMOS ROI technology, are used in the measurement system. The research shows that the angle measurement system based on IBIS-6600CMOS sensors can attain the 20°× 20° field of view, 2" accuracy, and 1Kframes/s speed. But the system is sensitive to the environment and it can only be worked in the laboratory.

Citation Download Citation

Gui-ying Zeng, Yuan Xie, and Jin-xing Chen "The evaluation system of the 2-D scanning mirror based on CMOS sensor", Proc. SPIE 7659, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Smart Structures and Materials in Manufacturing and Testing, 765915 (12 October 2010); https://doi.org/10.1117/12.865556

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KEYWORDS

Mirrors

CMOS sensors

CMOS technology

Satellites

Calibration

Scanners

Sensors

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