Paper
19 August 2010 Measuring of optics surface information with digital image processing technology
Shaojun Lu, Jun Han, Wang Liang, Weiguang Zhang, Baoyuan Liu, Jiaxing Hu, Liang Nie
Author Affiliations +
Proceedings Volume 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering; 782013 (2010) https://doi.org/10.1117/12.867631
Event: International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 2010, Xi'an, China
Abstract
The quality of optics' surface is of an important character which has critical influence in optical system. There are many ways to detect surface quality, but interferometry is considered as an effective technology. Interfere fringes which obtained from our experiment based on equal thickness interference were processed with digital image processing (DIP) technology in this paper. Image smoothing, fringes thinning, fringes' space measurement and P-V value measurement were done in this processing, Which can give optics' surface information automatically and accurately. We measured some optics whose apertures are not more than 30mm, and the result is satisfactory. Our method will be widely used in industrial inspection, especially in optical works in the future.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shaojun Lu, Jun Han, Wang Liang, Weiguang Zhang, Baoyuan Liu, Jiaxing Hu, and Liang Nie "Measuring of optics surface information with digital image processing technology", Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782013 (19 August 2010); https://doi.org/10.1117/12.867631
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Image processing

Digital image processing

Interferometers

Charge-coupled devices

Distortion

Error analysis

Optical testing

Back to Top