Sensor self-diagnostics for piezoelectric transducers operating in harsh temperature environments

Yan Zheng; Christian Martinez; Daniel Easton; Gyuhae Park; Kevin Farinholt

doi:10.1117/12.882009

28 April 2011 Sensor self-diagnostics for piezoelectric transducers operating in harsh temperature environments

Yan Zheng, Christian Martinez, Daniel Easton, Gyuhae Park, Kevin Farinholt

Proceedings Volume 7979, Industrial and Commercial Applications of Smart Structures Technologies 2011; 79790O (2011) https://doi.org/10.1117/12.882009
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2011, San Diego, California, United States

Abstract

In many condition and health monitoring applications, it is necessary to be able to differentiate between response characteristics that result from structural and sensor specific damage types. An investigation is presented in this paper that considers the effectiveness of sensor self-diagnostic techniques for piezoelectric-based transducers that operate in harsh temperature environments. The motivation behind this work is to develop a method for interrogating sensor health when embedded within high-cost research systems. The theoretical basis for this approach is first presented, along with several analytical test cases in which temperature effects are examined within models of the piezoelectric transducer. Following this, a series of experiments are presented in which transducers with varying types and degrees of damage are subject to repeated temperature cycling from cryogenic to room temperature. The results of this study indicate that capacitive-based self-diagnostic techniques are capable of detecting both sensor delamination and cracking at room and liquid nitrogen temperatures.

Citation Download Citation

Yan Zheng, Christian Martinez, Daniel Easton, Gyuhae Park, and Kevin Farinholt "Sensor self-diagnostics for piezoelectric transducers operating in harsh temperature environments", Proc. SPIE 7979, Industrial and Commercial Applications of Smart Structures Technologies 2011, 79790O (28 April 2011); https://doi.org/10.1117/12.882009

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