Hemispherical reflectance and emittance properties of carbon nanotubes coatings at infrared wavelengths

Manuel A. Quijada; John G. Hagopian; Stephanie Getty; Raymond E. Kinzer Jr.; Edward J. Wollack

doi:10.1117/12.894601

28 September 2011 Hemispherical reflectance and emittance properties of carbon nanotubes coatings at infrared wavelengths

Manuel A. Quijada, John G. Hagopian, Stephanie Getty, Raymond E. Kinzer Jr., Edward J. Wollack

Author Affiliations +

Proceedings Volume 8150, Cryogenic Optical Systems and Instruments XIII; 815002 (2011) https://doi.org/10.1117/12.894601
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

Recent visible wavelength observations of Multiwalled Carbon Nanotubes (MWCNT) coatings have revealed that they represent the blackest materials known in nature with a Total Hemispherical Reflectance (THR) of less than 0.25%. This makes them exceptionally good as absorbers, with the potential to provide order-ofmagnitude improvement in stray-light suppression over current black surface treatments when used in an optical system. Here we extend the characterization of this class of materials into the infrared spectral region to further evaluate their potential for use on instrument baffles for stray-light suppression and to manage spacecraft thermal properties through radiant heat transfer process. These characterizations will include the wavelength-dependent Total Hemispherical Reflectance (THR) properties in the mid- and far-infrared spectral regions (2-110 μm). Determination of the temperature-dependent emittance will be investigated in the temperature range of 40 to 300 K. These results will be compared with other more conventional black coatings such as Acktar Fractal Black or Z306 coatings among others.

Citation Download Citation

Manuel A. Quijada, John G. Hagopian, Stephanie Getty, Raymond E. Kinzer Jr., and Edward J. Wollack "Hemispherical reflectance and emittance properties of carbon nanotubes coatings at infrared wavelengths", Proc. SPIE 8150, Cryogenic Optical Systems and Instruments XIII, 815002 (28 September 2011); https://doi.org/10.1117/12.894601

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