Measurement of electro-optic effects in near-intrinsic silicon

Jinbo Mu; Jingcheng Zhu; Zhenyu Wang; Zhanguo Chen; Xiuhuan Liu; Yanjun Gao; Gang Jia

doi:10.1117/12.917589

15 November 2011 Measurement of electro-optic effects in near-intrinsic silicon

Jinbo Mu, Jingcheng Zhu, Zhenyu Wang, Zhanguo Chen, Xiuhuan Liu, Yanjun Gao, Gang Jia

Proceedings Volume 8335, 2012 International Workshop on Image Processing and Optical Engineering; 833502 (2011) https://doi.org/10.1117/12.917589
Event: 2012 International Workshop on Image Processing and Optical Engineering, 2012, Harbin, China

Abstract

The electro-optic effects in silicon include Kerr effect, plasma dispersion effect, and Franz-Keldysh effect etc.. Silicon does not have the linear electro-optic effect in the bulk because of the inversion symmetry, which restricts the development of the silicon-based optoelectronics and silicon photonics. However, the electric field can destroy the inversion symmetry of silicon, and produce so-called electric-field-induced linear electro-optic effect. In intrinsic or near-intrinsic silicon, these electro-optic effects exist simultaneously. In this paper, a transverse electro-optic modulation system was designed to detect these electro-optic effects. The electric-field-induced linear electro-optic effect was demonstrated in the space charge region of silicon sample and distinguished from Kerr effect based on the different frequency response. The relationship between the linear electro-optic signal and the azimuth angle of the analyzer was measured too, which was used for distinguishing the electric-field-induced linear electro-optic effect from the plasma dispersion effect. The results showed that the electric-field-induced linear electro-optic effect was stronger than Kerr effect and the plasma dispersion effect in the near-intrinsic silicon samples.

Citation Download Citation

Jinbo Mu, Jingcheng Zhu, Zhenyu Wang, Zhanguo Chen, Xiuhuan Liu, Yanjun Gao, and Gang Jia "Measurement of electro-optic effects in near-intrinsic silicon", Proc. SPIE 8335, 2012 International Workshop on Image Processing and Optical Engineering, 833502 (15 November 2011); https://doi.org/10.1117/12.917589

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
7 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Electro optics

Silicon

Plasma

Kerr effect

Polarization

Dispersion

Modulation

Show All Keywords

Keywords/Phrases

Search In:

Publication Years