Detection of surface defects by means of dynamic speckles

Ervin Nippolainen; Igor Sidorov; Alexei A. Kamshilin

doi:10.1117/12.976294

11 September 2012 Detection of surface defects by means of dynamic speckles

Ervin Nippolainen, Igor Sidorov, Alexei A. Kamshilin

Proceedings Volume 8413, Speckle 2012: V International Conference on Speckle Metrology; 841313 (2012) https://doi.org/10.1117/12.976294
Event: SPECKLE 2012: V International Conference on Speckle Metrology, 2012, Vigo, Spain

Abstract

In this paper we propose novel method possessing high fidelity and versatility for surface defect detection based on the spatially filtered dynamic speckles. It is shown that resolution of proposed method depends on the geometrical parameters of the optical system. The feasibility of the novel method for surface defect detection is demonstrated by experimental results which are in good agreement with theoretical estimations.

Citation Download Citation

Ervin Nippolainen, Igor Sidorov, and Alexei A. Kamshilin "Detection of surface defects by means of dynamic speckles", Proc. SPIE 8413, Speckle 2012: V International Conference on Speckle Metrology, 841313 (11 September 2012); https://doi.org/10.1117/12.976294

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