A method for phase unwrapping base digital spackle correlation

Dong He; Ameng Li; Xiaoli Liu; Xiang Peng

doi:10.1117/12.999965

20 November 2012 A method for phase unwrapping base digital spackle correlation

Dong He, Ameng Li, Xiaoli Liu, Xiang Peng

Proceedings Volume 8563, Optical Metrology and Inspection for Industrial Applications II; 856317 (2012) https://doi.org/10.1117/12.999965
Event: Photonics Asia, 2012, Beijing, China

Abstract

A new method for phase unwrapping is proposed, which makes the unwrapping of phase images realistic without binary codes or more frequency fringe images produced by projection systems, uses only one additional digital speckle pattern projected to help finding correspondence points. It means that the novel method is by the use of the additional speckle pattern to achieve a unique point correspondence. The proposed method to get unwrapped phase will save images recorded time. Experiment results demonstrated the proposed method is effective and robust.

Citation Download Citation

Dong He, Ameng Li, Xiaoli Liu, and Xiang Peng "A method for phase unwrapping base digital spackle correlation", Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 856317 (20 November 2012); https://doi.org/10.1117/12.999965

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available