Paper
19 October 1987 New Aspects Of Automatic Fringe Patterns Analysis By Phase Stepped Method: Multichannel Holographic Interferometry
Malgorzata Kujawinska
Author Affiliations +
Proceedings Volume 0859, Laser Technology II; (1987) https://doi.org/10.1117/12.943362
Event: Second Symposium on Laser Technology, 1987, Warsaw, Poland
Abstract
Modified holographic interferometers are described which enable automatic fringe pattern analysis to be achieved when recording transient events. The introduction of a phase grating enables the method of phase-stepping fringe analysis to be applied to a wide range of metrological problems. The theory of three- and fourchannel holographic interferometers is developed and an analysis of the sources of error is presented with the aid of computer simulations. The adjustment procedure and initial experimental results are shown to confirm the utility of the systems.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Malgorzata Kujawinska "New Aspects Of Automatic Fringe Patterns Analysis By Phase Stepped Method: Multichannel Holographic Interferometry", Proc. SPIE 0859, Laser Technology II, (19 October 1987); https://doi.org/10.1117/12.943362
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KEYWORDS
Fringe analysis

Error analysis

Diffraction gratings

Interferometers

Diffraction

Holography

Sensors

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