Paper
11 June 2013 Influence of pixel geometry on the 1/f noise coefficient
Francis Généreux, Jacques-Edmond Paultre, Bruno Tremblay, Francis Provençal, Christine Alain
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Abstract
This paper presents a systematic study of the 1/f noise coefficient as a function of pixel geometry for microbolometer structures. Structures with various VOx widths, electrode gaps, electrode widths and via hole sizes were fabricated and characterized. The experimental results show that the 1/f noise coefficient is adversely affected by current non uniformity, in agreement with model predictions. Design parameters that significantly impact current non uniformity are identified and approaches to minimize their importance are proposed.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Francis Généreux, Jacques-Edmond Paultre, Bruno Tremblay, Francis Provençal, and Christine Alain "Influence of pixel geometry on the 1/f noise coefficient", Proc. SPIE 8704, Infrared Technology and Applications XXXIX, 87041Q (11 June 2013); https://doi.org/10.1117/12.2016250
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Cited by 5 scholarly publications.
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KEYWORDS
Electrodes

Scanning electron microscopy

Thin films

Oxides

Vanadium

Bolometers

Deposition processes

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