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In this work split-gate charge trap FLASH memory with a storage layer containing 3D nano-crystals is proposed and
compared with existing sub-90 nm solutions. We estimate electrical properties, cell operations and reliability issues.
Analytical predictions show that for nano-crystals with the diameter < 3 nm metals could be the preferred material. The
presented 3D layers were fabricated in a CMOS compatible process. We also show what kinds of nano-crystal
geometries and distributions could be achieved. The study shows that the proposed memory cells have very good
program/erase/read characteristics approaching those of SONOS cells but better retention time than standard discrete
charge storage cells. Also dense nano-crystal structure should allow 2-bits of information to be stored.
Andrzej Kołodziej,Lidia Łukasiak, andMichał Kołodziej
"Nanostructures applied to bit-cell devices", Proc. SPIE 8902, Electron Technology Conference 2013, 89020X (25 July 2013); https://doi.org/10.1117/12.2031301
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Andrzej Kołodziej, Lidia Łukasiak, Michał Kołodziej, "Nanostructures applied to bit-cell devices," Proc. SPIE 8902, Electron Technology Conference 2013, 89020X (25 July 2013); https://doi.org/10.1117/12.2031301