Paper
17 September 2013 Optical nonlinearity measurements of copper phthalocyanine film
Author Affiliations +
Proceedings Volume 8904, International Symposium on Photoelectronic Detection and Imaging 2013: High Power Lasers and Applications; 890412 (2013) https://doi.org/10.1117/12.2034318
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China
Abstract
The nonlinear refractive response of a copper phthalocyanine film fabricated by the electro-deposition is investigated by a modified top-hat Z-scan with 19 picoseconds pulse at wavelength of 532 nm. Compared to the top-hat Z-scan, the curve of modified top-hat Z-scan for the nonlinear refraction shows a single peak rather than a peek-valley curve. Furthermore, the sensitivity of this new technique can be more than two orders of magnitude enhanced. The results show that the film has obvious response of nonlinear refraction. The theoretical simulation fit well with experimental results.
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Li-hao Luo, Yu Fang, Xiang-yong Chu, Xing-zhi Wu, Junyi Yang, and Ying-lin Song "Optical nonlinearity measurements of copper phthalocyanine film", Proc. SPIE 8904, International Symposium on Photoelectronic Detection and Imaging 2013: High Power Lasers and Applications, 890412 (17 September 2013); https://doi.org/10.1117/12.2034318
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KEYWORDS
Refraction

Copper

Nonlinear optics

Transmittance

Picosecond phenomena

Optical testing

Sensors

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