Gaussian beam scattering from a hemispherical boss

Hui-Yu Li; Qi Li; Zheng-Jun Liu; Yong-Peng Zhao; De-Ying Chen; Qi Wang

doi:10.1117/12.2032870

23 August 2013 Gaussian beam scattering from a hemispherical boss

Hui-Yu Li, Qi Li, Zheng-Jun Liu, Yong-Peng Zhao, De-Ying Chen, Qi Wang

Proceedings Volume 8909, International Symposium on Photoelectronic Detection and Imaging 2013: Terahertz Technologies and Applications; 89090B (2013) https://doi.org/10.1117/12.2032870
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China

Abstract

In the calculation of the rough surface, one of the methods to establish the model is to view the rough surface as a plate with hemispherical bosses. Thus the calculation of a hemispherical boss becomes a part of the simulation of the rough surface. With the development of radar technology, the requirement of the radar cross section (RCS) becomes higher, which makes the measurement and calculation of the terahertz RCS become more important. However, due to the different energy distribution between the Gaussian beam and plane wave, the simulation results would exist some error when assuming that the incident beam is a plane wave. In this paper, the method of images is utilized to calculate the RCS of a hemispherical boss at 2.52 THz when the incident beam is Gaussian beam and the results are compared to that calculated when the incident is plane wave.

Citation Download Citation

Hui-Yu Li, Qi Li, Zheng-Jun Liu, Yong-Peng Zhao, De-Ying Chen, and Qi Wang "Gaussian beam scattering from a hemispherical boss", Proc. SPIE 8909, International Symposium on Photoelectronic Detection and Imaging 2013: Terahertz Technologies and Applications, 89090B (23 August 2013); https://doi.org/10.1117/12.2032870

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