Focused ion beam 3D nano-patterned optical fiber tips for advanced beam profile engineering

Ricardo Janeiro; Raquel Flores; Ana R. Ribeiro; Pedro Jorge; Jaime Viegas

doi:10.1117/12.2079143

13 March 2015 Focused ion beam 3D nano-patterned optical fiber tips for advanced beam profile engineering

Ricardo Janeiro, Raquel Flores, Ana R. Ribeiro, Pedro Jorge, Jaime Viegas

Proceedings Volume 9374, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics VIII; 93740E (2015) https://doi.org/10.1117/12.2079143
Event: SPIE OPTO, 2015, San Francisco, California, United States

Abstract

Focused ion beam (FIB) patterning of 3D topography on optical fiber tips for application in stand-alone, rugged and simplified setups for optical tweezers cell sorters, optical near-field lithography and optical beam profile engineering are reported. We demonstrate various configurations based on single-step FIB patterning, multiple-step FIB processing and hybrid approaches based on optical fiber pre- and post-FIB treatment with either etching, fusion splicing, photopolymerization or electroplating steps for optical fiber texture, topography and composition engineering. Different conductive coatings for minimal charge accumulation and beam drift are studied with the relative merits compared. Furthermore optimal beam parameters for accurate pattern replication and positioning are also presented. Measured experimental field profiles are compared with numerical simulations of fabricated optical fiber tips for fabrication accuracy evaluation. Applications employing these engineered fiber tips in the field of optical tweezers, optical vortex generation, photolithography, photo-polymerization and beam forming are presented.

Citation Download Citation

Ricardo Janeiro, Raquel Flores, Ana R. Ribeiro, Pedro Jorge, and Jaime Viegas "Focused ion beam 3D nano-patterned optical fiber tips for advanced beam profile engineering", Proc. SPIE 9374, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics VIII, 93740E (13 March 2015); https://doi.org/10.1117/12.2079143

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