Speckle referencing: digital speckle pattern interferometry (SR- DSPI) for imaging of non-diffusive surfaces

Chaolong Song; Murukeshan V. Matham; Kelvin H. K. Chan

doi:10.1117/12.2190504

17 July 2015 Speckle referencing: digital speckle pattern interferometry (SR- DSPI) for imaging of non-diffusive surfaces

Chaolong Song, Murukeshan V. Matham, Kelvin H. K. Chan

Author Affiliations +

Proceedings Volume 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015); 95242P (2015) https://doi.org/10.1117/12.2190504
Event: International Conference on Optical and Photonic Engineering (icOPEN2015), 2015, Singapore, Singapore

Abstract

Optical metrology has been widely employed as a key technique for modern industrial production, owing to its fast, precise and non-invasive measurement. Digital speckle pattern interferometry (DSPI) is one of these non-destructive testing methods that possess the abilities to measure surface deformation, vibration and profile. However, one of the challenges with DSPI is the incapability to address the imaging of non-diffusive surface, owing to the failure to form speckle pattern. In this paper, we demonstrate a modified DSPI system used for non-diffusive surface measurement. Experiment has been carried out to validate this modified DSPI by using metal-alloy surface as testing sample. The speckle fringe pattern generated by applying an external load was analyzed to obtain the 3-D surface deformation parameters.

Citation Download Citation

Chaolong Song, Murukeshan V. Matham, and Kelvin H. K. Chan "Speckle referencing: digital speckle pattern interferometry (SR- DSPI) for imaging of non-diffusive surfaces", Proc. SPIE 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015), 95242P (17 July 2015); https://doi.org/10.1117/12.2190504

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