Modeling and analysis of the two-dimensional polystyrene aggregation process

Krzysztof Skorupski; Imre Horvath; Maria Rosaria Vetrano

doi:10.1117/12.2184640

22 June 2015 Modeling and analysis of the two-dimensional polystyrene aggregation process

Krzysztof Skorupski, Imre Horvath, Maria Rosaria Vetrano

Proceedings Volume 9530, Automated Visual Inspection and Machine Vision; 95300H (2015) https://doi.org/10.1117/12.2184640
Event: SPIE Optical Metrology, 2015, Munich, Germany

Abstract

Small particles tend to aggregate and create large fractal-like structures which can be analysed using microscopy techniques. In this work we present an algorithm capable of measuring the basic morphological parameters of two-dimensional polystyrene layers. Our study was divided into two separate parts. The goal of the first one was to create high quality particle monolayers. Their purpose was to allow for monitoring of the two-dimensional aggregation process by means of optical microscopy. In the next step microscopy images were analysed in more detail. The size distribution function and the total number of particles were calculated. When an aggregate was larger than a specified size its fractal dimension was approximated using the box-counting technique. After retrieving the morphological parameters fractal-like aggregate models were created using the most common tunable algorithms. Our study proved that real structures resemble to geometries generated with CC (Cluster-Cluster) aggregation techniques. Initial clusters, i.e. those generated during early stages of the aggregation process, are characterized by slightly larger fractal dimension. However, its value decreases along with the aggregation time. The next step is to improve our algorithm even further and use it in a fully automatic on-line monitoring process.

Citation Download Citation

Krzysztof Skorupski, Imre Horvath, and Maria Rosaria Vetrano "Modeling and analysis of the two-dimensional polystyrene aggregation process", Proc. SPIE 9530, Automated Visual Inspection and Machine Vision, 95300H (22 June 2015); https://doi.org/10.1117/12.2184640

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KEYWORDS

Particles

Fractal analysis

Microscopy

Neptunium

Algorithm development

Image analysis

Image processing

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