Paper
26 January 2016 Modeling and analyzing characteristics of self-infrared radiation on airplane-skin
Author Affiliations +
Proceedings Volume 9796, Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015; 97962M (2016) https://doi.org/10.1117/12.2229464
Event: Selected Proceedings of the Chinese Society for Optical Engineering Conferences held November 2015, 2015, Various, China
Abstract
The characteristic of the self-infrared radiation of airplane-skin is very important for the stealth performance of airplane. Based on the theory of the airplane-skin temperature field, the distribution of the atmospheric temperature field and the principle of the black-body radiation function the self-infrared radiation model was established. In specified flight conditions, the influence of the atmospheric temperature, the speed of flight, the emissivity and the sight angle detection on the self-infrared radiation of the airplane skin were analyzed. Through the simulation of infrared radiation, some results under different flight states are obtained. The simulation results show that skin infrared radiation energy mainly concentrate on the far infrared wavebands, and various factors have different effects on the infrared radiation of skin. This conclusion can help reduce the infrared radiation and improve the stealth performance of airplane in the engineering design and the selection of flight conditions.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhaozhao Li, Wenyuan Wu, Chengguo Wu, Yuntao Yang, Yanhua Huang, and Zhuan Sunxiaobo "Modeling and analyzing characteristics of self-infrared radiation on airplane-skin", Proc. SPIE 9796, Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015, 97962M (26 January 2016); https://doi.org/10.1117/12.2229464
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KEYWORDS
Infrared radiation

Skin

Radiation effects

Atmospheric modeling

Data modeling

Solar radiation

Temperature metrology

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