DataRay Inc.: Automated M-squared measurements at 1550 nm with DataRay's new WinCamD-QD-1550 beam profiler

Logan Hatanaka

doi:10.1117/12.2580598

20 August 2020 DataRay Inc.: Automated M-squared measurements at 1550 nm with DataRay's new WinCamD-QD-1550 beam profiler

Logan Hatanaka

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Proceedings Volume OP20EX, SPIE Exhibition Product Demonstrations; OP20EX08 (2020) https://doi.org/10.1117/12.2580598
Event: Exhibitor Forum, 2020, Online Only

Abstract

In this demo, we will be showing how DataRay's new WinCamD-QD-1550 beam profiler can easily perform an automated M-squared measurement of a 1550 nm beam in the DataRay software. For more information on the WinCamD-QD-1550 please contact DataRay by emailing sales@dataray.com, calling +1-530-395-2500, or visiting www.dataray.com.

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Logan Hatanaka "DataRay Inc.: Automated M-squared measurements at 1550 nm with DataRay's new WinCamD-QD-1550 beam profiler", Proc. SPIE OP20EX, SPIE Exhibition Product Demonstrations, OP20EX08 (20 August 2020); https://doi.org/10.1117/12.2580598

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