Non-destructive photoluminescence investigation of PV devices with high spatial resolution microscope techniques

Christian Oelsner; Volker Buschmann; Felix Koberling; Rainer Erdmann; Uwe Ortmann; Linnea Olofsson

doi:10.1117/12.2605882

7 March 2022 Non-destructive photoluminescence investigation of PV devices with high spatial resolution microscope techniques

Christian Oelsner, Volker Buschmann, Felix Koberling, Rainer Erdmann, Uwe Ortmann, Linnea Olofsson

Author Affiliations +

Proceedings Volume PC11996, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices XI; PC119960L (2022) https://doi.org/10.1117/12.2605882
Event: SPIE OPTO, 2022, San Francisco, California, United States

Conference Poster

Abstract

Investigations of photovoltaic devices and semiconductors are essential to enhance the efficiency of preparation methods as well as their electronic and optical properties. We present a powerful combination of time-resolved photoluminescence microscopy with a spectrometer, which results in a powerful toolbox for researcher. This combination of microscopic (e.g., FLIM, PLIM or carrier diffusion imaging) and spectroscopic methods like wavelength dependent emission scanning enables investigations of photophysical properties of semiconductors, nanoparticles and nanostructures on a whole new level.

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Christian Oelsner, Volker Buschmann, Felix Koberling, Rainer Erdmann, Uwe Ortmann, and Linnea Olofsson "Non-destructive photoluminescence investigation of PV devices with high spatial resolution microscope techniques", Proc. SPIE PC11996, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices XI, PC119960L (7 March 2022); https://doi.org/10.1117/12.2605882

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