Poster
31 October 2022 SCREEN's DT-3000 track-booster system: how can hardware improve EUV performance?
Author Affiliations +
Conference Poster
There is no online version at this time. The PDF is only available to people who have bought the paper or have a subscription.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andreia Santos, Yuji Tanaka, Masaya Asai, Masahiko Harumoto, Wesley Zanders, Jelle Vandereyken, Lander Verstraete, Ashish Rathore, and Hyo Seon Suh "SCREEN's DT-3000 track-booster system: how can hardware improve EUV performance?", Proc. SPIE PC12292, International Conference on Extreme Ultraviolet Lithography 2022, PC122920W (31 October 2022); https://doi.org/10.1117/12.2643150
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Extreme ultraviolet

Extreme ultraviolet lithography

Line width roughness

Lithography

Ecosystems

Optical lithography

Semiconducting wafers

Back to Top