Presentation
13 March 2024 Single-shot wavefront sensing with nonlocal thin film optical filters
Author Affiliations +
Proceedings Volume PC12852, Quantitative Phase Imaging X; PC128520B (2024) https://doi.org/10.1117/12.3003621
Event: SPIE BiOS, 2024, San Francisco, California, United States
Abstract
Conventional wavefront sensors suffer from the fundamental limitation of the space-bandwidth product, and have a trade-off between their spatial sampling interval and dynamic range. Here, we leverage nonlocal thin film optical filters with optimized angle- and polarization-dependent response to circumvent the fundamental limitation, and realized a robust single-shot wavefront sensing system with a small spatial sampling interval of 6.9 μm and a large angular dynamic range of 15°. The system only requires inserting two multilayer dielectric filters, fabricated using a mature thin film deposition technique, into a conventional 4-f imaging apparatus. The polarization-sensitive nonlocal filters are used to map the 2D phase gradients of the incident light field to the intensity variation of the x- and y-polarized light, respectively, thus enabling single-shot 2D wavefront reconstruction from images taken by a polarization camera. Such a system may be used for a variety of applications, including high-resolution image aberration correction, surface metrology, and quantitative phase imaging.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Liu Li and Yuanmu Yang "Single-shot wavefront sensing with nonlocal thin film optical filters", Proc. SPIE PC12852, Quantitative Phase Imaging X, PC128520B (13 March 2024); https://doi.org/10.1117/12.3003621
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KEYWORDS
Wavefront sensors

Optical filters

Thin films

Cameras

Polarization

Incident light

Interferometers

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