Emilio Milana, C Morandi, C Truzzi, Francesco Ziprani
Optical Engineering, Vol. 30, Issue 10, (October 1991) https://doi.org/10.1117/12.55964
TOPICS: Diffraction, Radium, Machine learning, Image classification, Surface finishing, Statistical analysis, Classification systems, Objectives, CCD image sensors, Sensors
The feasibility of a system for the classification of machined surfaces based on the 2-D analysis of a diffraction pattern obtained by suitably illuminating the sample is discussed. Preliminary experimental results, obtained with a nonparametric Bayesian classifier, are presented.