High-accuracy critical angle refractometry

Diana Tentori-Santa-Cruz; Carlos Lopez Famozo

doi:10.1117/12.61047

1 March 1993 High-accuracy critical angle refractometry

Diana Tentori-Santa-Cruz, Carlos Lopez Famozo

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Optical Engineering, Vol. 32, Issue 3, (March 1993). https://doi.org/10.1117/12.61047

Abstract

The measurement requirements of fifth-place refractometers based on the critical angle condition are analyzed. It is shown that the reference prism geometry limits the working interval of these instruments and that polarized light can be used to improve sensitivity.

Citation Download Citation

Diana Tentori-Santa-Cruz and Carlos Lopez Famozo "High-accuracy critical angle refractometry," Optical Engineering 32(3), (1 March 1993). https://doi.org/10.1117/12.61047

Published: 1 March 1993

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