1 June 1994 Fringe tracing by image processing
Anil G. Khadakkar, Venkatesh Jyothi, Rajagopal Narayanan
Author Affiliations +
Abstract
The optical techniques of stress analysis, such as, holography, photoelasticity, and moiré, produce results in the form of whole-field fringe patterns representing physical measurements. The accuracy of results will depend on how precisely fringe orders and fringe locations are determined. A detailed account of an accurate and automatic method of tracing the centerlines of dark and bright fringes using image processing is presented. The variance of gray-level values across fringe width is used as a criterion for determining fringe direction. The determination of fringe direction is done in an operator window of size 5 x 5, 7 x 7, or 9 x 9 pixels at the central pixel of the window. Sequential application of this condition enables the user to trace the fringe centerline. Using the capabilities of image-processing equipment, the cursor, and the specially developed computer program, holographic fringes of different patterns were traced. A few of these cases are presented as illustrative examples. It is also shown that the technique can be successfully applied to fringes that close on themselves so as to form closed loops.
Anil G. Khadakkar, Venkatesh Jyothi, and Rajagopal Narayanan "Fringe tracing by image processing," Optical Engineering 33(6), (1 June 1994). https://doi.org/10.1117/12.167158
Published: 1 June 1994
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Fringe analysis

Holography

Image processing

Software

Holograms

Moire patterns

Photoelasticity

RELATED CONTENT

Photomechanical Analysis Of Composite And Other Materials
Proceedings of SPIE (February 17 1987)
Study of plate vibrations by moire holography
Proceedings of SPIE (October 01 1991)
Shearing Photoelasticity
Proceedings of SPIE (March 31 1989)
One-Step Rainbow Holographic Interferometry
Proceedings of SPIE (December 25 1979)

Back to Top