Considerations on the finesse and resolving power of Fabry-Perot etalons for soft x rays

Christophe Guichet; Georges Rasigni

doi:10.1117/1.601384

1 July 1997 Considerations on the finesse and resolving power of Fabry-Perot etalons for soft x rays

Christophe Guichet, Georges Rasigni

Optical Engineering, Vol. 36, Issue 7, (July 1997). https://doi.org/10.1117/1.601384

Some considerations of the spectroscopic performance of a soft x-ray Fabry-Pe´ rot e´ talon (XFPE) are presented. A whole study of the phase change on reflection of a soft x ray multilayer interferential mirror (MIM) has been necessary to evaluate the theoretical behavior of the order of interference of an XFPE. For grazing incidence angles, there is a linear dependence between the latter parameter and the grazing angle in the range of the diffraction Bragg peak. This property has enabled us to obtain local expressions for the finesse and the resolving power of an XFPE. Numerical simulations emphasize the interest of such a structure in x-ray spectroscopy.

Citation Download Citation

Christophe Guichet and Georges Rasigni "Considerations on the finesse and resolving power of Fabry-Perot etalons for soft x rays," Optical Engineering 36(7), (1 July 1997). https://doi.org/10.1117/1.601384

Published: 1 July 1997

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available