Object field expansion in spatial light modulator-based phase contrast microscopy

Malte Hasler; Janek Stahl; Tobias Haist; Wolfgang Osten

doi:10.1117/1.OE.54.4.043107

20 April 2015 Object field expansion in spatial light modulator-based phase contrast microscopy

Malte Hasler, Janek Stahl, Tobias Haist, Wolfgang Osten

Author Affiliations +

Optical Engineering, Vol. 54, Issue 4, 043107 (April 2015). https://doi.org/10.1117/1.OE.54.4.043107

Abstract

In order to expand the field of view in spatial light modulator-based phase contrast microscopy, we employ a two-image recording method with digital postprocessing. Using this approach, we suppress the superimposed unwanted diffraction orders on the image sensor, thus eliminating the necessity to assure a strict separation of the diffraction orders. These methods allow for a significantly smaller microscope setup and an increased effective spatial bandwidth product. We apply this method for a number of phase contrast methods to show its capabilities and limitations. Mainly, the signal-to-noise ratio is decreased by η/2. Furthermore, we employ a simple field-dependent aberration correction scheme to improve the image quality.√In order to expand the field of view in spatial light modulator-based phase contrast microscopy, we employ a two-image recording method with digital postprocessing. Using this approach, we suppress the superimposed unwanted diffraction orders on the image sensor, thus eliminating the necessity to assure a strict separation of the diffraction orders. These methods allow for a significantly smaller microscope setup and an increased effective spatial bandwidth product. We apply this method for a number of phase contrast methods to show its capabilities and limitations. Mainly, the signal-to-noise ratio is decreased by η/√2. Furthermore, we employ a simple field-dependent aberration correction scheme to improve the image quality.

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Malte Hasler, Janek Stahl, Tobias Haist, and Wolfgang Osten "Object field expansion in spatial light modulator-based phase contrast microscopy," Optical Engineering 54(4), 043107 (20 April 2015). https://doi.org/10.1117/1.OE.54.4.043107

Published: 20 April 2015

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