8 December 2016 Comprehensive vertical-cavity surface-emitting laser model for optical interconnect transceiver circuit design
Binhao Wang, Wayne V. Sorin, Samuel Palermo, Michael R. T. Tan
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Abstract
Directly modulated vertical-cavity surface-emitting lasers (VCSELs) are commonly used in short-reach optical interconnect applications. To enable efficient optical interconnect transceiver systems operating at data rates up to 25  Gb/s and beyond, cosimulation environments, which allow for the optimization of driver circuitry with accurate compact VCSEL models, are necessary. A comprehensive VCSEL model, which captures thermally dependent electrical and optical dynamics and provides direct current, small-, and large-signal simulation capabilities with self-consistency, is presented. The device’s electrical behavior is described with an equivalent circuit, which captures both large-signal operation and electrical parasitics, while the optical response is captured with a rate-equation-based model. Bias and temperature dependencies are incorporated into both key electrical and optical model parameters. Experimental verification of the model is performed at 25  Gb/s with a 990-nm VCSEL to study the impact of bias current level and substrate temperature.
Binhao Wang, Wayne V. Sorin, Samuel Palermo, and Michael R. T. Tan "Comprehensive vertical-cavity surface-emitting laser model for optical interconnect transceiver circuit design," Optical Engineering 55(12), 126103 (8 December 2016). https://doi.org/10.1117/1.OE.55.12.126103
Published: 8 December 2016
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CITATIONS
Cited by 17 scholarly publications.
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KEYWORDS
Vertical cavity surface emitting lasers

Optical interconnects

Data modeling

Thermal modeling

Transceivers

Optical circuits

Temperature metrology

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