We propose a scanning optical microscope, for samples introducing spatially varying aberrations to the illumination
beam. It is implemented with a microscope that has binary hologram based beam scanning mechanism where
illumination beam phase profile is varied from pixel to pixel. Unlike a conventional scanning microscope, the scanning is
achieved by the beam diffracted from a binary hologram written on the display panel of a liquid crystal spatial light
modulator. The aberration correction is achieved without a separate wavefront sensor. For correcting the aberration in the
illumination beam the signal is maximized by changing the shape of the binary hologram in terms of chosen Zernike
mode coefficients.
High speed wavefront sensing is important in real time profile analysis, analysis of fluid dynamics, ophthalmology and so on. Conventional Shack-Hartmann wavefront sensor uses an array of tiny lenses and a digital camera to record the focal spot array. Thus the frame rate of the sensor depends on the camera. In this paper we present a zonal wavefront sensor where the array of lenses is replaced by an array of gratings followed by a focusing lens. The gratings can be configured to generate just one array of focal spots. This reduction in row of the focal spot array leads to increase in the frame rate of the proposed wavefront sensor.
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