Dr. Alex Dommann Profile

Dr. Alex Dommann

Head of Dept at EMPA

SPIE Involvement:

Author

Publications (8)

Proceedings Article | 13 March 2019 Presentation

Polarimetric imaging of the light backscattered from multiply scattering nanofibrous PVDFhfp scaffolds (Conference Presentation)

Arushi Jain, Anjani Maurya, Alex Dommann, Antonia Neels, Martin Frenz, H. Günhan Akarçay

Proceedings Volume 10890, 108900E (2019) https://doi.org/10.1117/12.2507399

KEYWORDS: Light scattering, Scattering, Polarimetry, Tissue optics, Backscatter, Laser scattering, Nanofibers, Polarization, Optical fibers, Microscopes

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SPIE Journal Paper | 18 December 2014

Evaluation of silicon tuning fork resonators under mechanical loads and space-relevant radiation conditions

Tobias Bandi, Jacek Baborowski, Alex Dommann, Herbert Shea, Francis Cardot, Antonia Neels

JM3, Vol. 13, Issue 04, 043019, (December 2014) https://doi.org/10.1117/12.10.1117/1.JMM.13.4.043019

KEYWORDS: Resonators, Silicon, Microelectromechanical systems, Aluminum nitride, Tolerancing, Radiation effects, Ions, Quartz, Space operations, Ionization

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Proceedings Article | 7 March 2014 Paper

Improved test setup for MEMS mechanical strength investigations and fabrication process qualification

T. Bandi, X. Maeder, A. Dommann, H. Shea, A. Neels

Proceedings Volume 8975, 897509 (2014) https://doi.org/10.1117/12.2044212

KEYWORDS: Silicon, Microelectromechanical systems, Reliability, Microfabrication, Etching, Semiconducting wafers, Data modeling, Laser cutting, Resistance, X-ray diffraction

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Proceedings Article | 7 March 2014 Paper

Evaluation of silicon tuning-fork resonators under space-relevant radiation conditions

T. Bandi, J. Baborowski, A. Dommann, H. Shea, F. Cardot, A. Neels

Proceedings Volume 8975, 89750I (2014) https://doi.org/10.1117/12.2044209

KEYWORDS: Resonators, Silicon, Electrons, Microelectromechanical systems, Aluminum nitride, Radiation effects, Tolerancing, Ionization, Ions, Space operations

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Proceedings Article | 13 March 2013 Paper

Factors controlling the incubation in the application of ps laser pulses on copper and iron surfaces

B. Neuenschwander, B. Jaeggi, M. Schmid, A. Dommann, A. Neels, T. Bandi, G. Hennig

Proceedings Volume 8607, 86070D (2013) https://doi.org/10.1117/12.2004136

KEYWORDS: Copper, Iron, Reflectivity, Crystals, Oxygen, Argon, Gases, Aluminum, Nitrogen, Single crystal X-ray diffraction

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Proceedings Article | 9 March 2013 Paper

Making MEMS more suited for Space: assessing the proton-radiation tolerance of structural materials for microsystems in orbit

Tobias Bandi, João Polido-Gomes, Antonia Neels, Alex Dommann, Herbert Shea

Proceedings Volume 8614, 86140M (2013) https://doi.org/10.1117/12.2004705

KEYWORDS: Microelectromechanical systems, Resonators, Silicon, Crystals, Polymers, Epoxies, Ions, Tolerancing, Microsystems, Particles

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Proceedings Article | 18 February 2011 Paper

Reliability of MEMS

Alex Dommann, Antonia Neels

Proceedings Volume 7928, 79280B (2011) https://doi.org/10.1117/12.876574

KEYWORDS: Microelectromechanical systems, Reliability, Interfaces, X-ray diffraction, Crystals, Deep reactive ion etching, X-rays, Sensors, Single crystal X-ray diffraction, Silicon

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Proceedings Article | 16 January 2003 Paper

Reciprocating silicon microtribometer

Philippe Dubois, Stephane von Gunten, August Enzler, Urs Lippuner, Alex Dommann, Nicolaas-F. de Rooij

Proceedings Volume 4980, (2003) https://doi.org/10.1117/12.478200

KEYWORDS: Silicon, Finite element methods, Optical simulations, Silicon films, Deep reactive ion etching, Semiconducting wafers, Aluminum, Thin films, Photomasks, Crystals

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Showing 5 of 8 publications

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