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Dr. Andries J. Scholten
at NXP Semiconductors N.V.
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Publications (1)
Proceedings Article | 12 May 2003 Paper
Compact modeling of noise for RF CMOS circuit
Andries Scholten, Luuk Tiemeijer, Ronald van Langevelde, Ramon Havens, Adrie Zegers-van Duijnhoven, Randy de Kort, Vincent Venezia, Dirk Klaassen
Proceedings Volume 5113, (2003) https://doi.org/10.1117/12.492939
KEYWORDS: Resistance, Field effect transistors, Data modeling, Molybdenum, CMOS technology, Radio frequency circuits, Thermal modeling, Instrument modeling, Solids, Transistors
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