Mr. Avinash Burla Profile

Avinash Burla

at Univ Stuttgart

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Publications (10)

SPIE Journal Paper | 5 June 2012

Genetic programming applied to automatic algorithm design in multi-scale inspection systems

Avinash Burla, Tobias Haist, Wolfram Lyda, Wolfgang Osten

OE, Vol. 51, Issue 6, 067001, (June 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.6.067001

KEYWORDS: Genetics, Computer programming, Inspection, Detection and tracking algorithms, Binary data, Evolutionary algorithms, Sensors, Defect detection, Algorithm development, Optical engineering

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Proceedings Article | 28 April 2012 Paper

Extrinsic calibration of a fringe projection sensor based on a zoom stereo microscope in an automatic multiscale measurement system

Marc Gronle, Wolfram Lyda, Avinash Burla, Wolfgang Osten

Proceedings Volume 8430, 84300J (2012) https://doi.org/10.1117/12.922583

KEYWORDS: Sensors, Calibration, Zoom lenses, Clouds, Inspection, Microscopes, Data modeling, Data acquisition, Fringe analysis, Sensor calibration

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Proceedings Article | 23 May 2011 Paper

Assistant systems for efficient multiscale measurement and inspection

Avinash Burla, Tobias Haist, Wolfram Lyda, Mohamed Hassanine Aissa, Wolfgang Osten

Proceedings Volume 8082, 808202 (2011) https://doi.org/10.1117/12.889344

KEYWORDS: Sensors, Inspection, Defect detection, Image processing, Genetic algorithms, Binary data, Genetics, Optical inspection, Microscopes, Detection and tracking algorithms

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SPIE Journal Paper | 1 April 2011

Fourier descriptors for defect indication in a multiscale and multisensor measurement system

Avinash Burla, Tobias Haist, Wolfram Lyda, Wolfgang Osten

OE, Vol. 50, Issue 04, 043603, (April 2011) https://doi.org/10.1117/12.10.1117/1.3562319

KEYWORDS: Lenses, Microlens array, Sensors, Confocal microscopy, Microscopes, Defect detection, Inspection, Microlens, Optical engineering, Monochromatic aberrations

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Proceedings Article | 8 September 2010 Paper

Rapid ideal template creation for the inspection of MEMS based on self-similarity characteristics

Avinash Burla, Tobias Haist, Wolfram Lyda, Anto Yesuadimai Michael, Wolfgang Osten

Proceedings Volume 7798, 77981W (2010) https://doi.org/10.1117/12.860359

KEYWORDS: Image segmentation, Microelectromechanical systems, Sensors, Calibration, Inspection, Image processing algorithms and systems, Optical resolution, Image processing, Actuators, Edge detection

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Proceedings Article | 31 August 2010 Open Access

Learning by playing: how to create the perfect learning game for and with optics

Tobias Haist, Avinash Burla

Proceedings Volume 7783, 77830E (2010) https://doi.org/10.1117/12.860430

KEYWORDS: Polarization, Projection systems, RGB color model, Polarizers, Birefringence, Photography, Outreach programs, Current controlled current source, Negative feedback, Distortion

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Proceedings Article | 2 August 2010 Paper

An assistance system for the selection of sensors in multi-scale measurement systems

Avinash Burla, Tobias Haist, Wolfram Lyda, Wolfgang Osten

Proceedings Volume 7791, 77910I (2010) https://doi.org/10.1117/12.860368

KEYWORDS: Sensors, Inspection, Cameras, Computing systems, Optical inspection, Imaging systems, Systems modeling, Light sources and illumination, Optical testing, Defect detection

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Proceedings Article | 14 May 2010 Paper

Automated multiscale measurement system for MEMS characterisation

W. Lyda, A. Burla, T. Haist, J. Zimmermann, W. Osten, O. Sawodny

Proceedings Volume 7718, 77180G (2010) https://doi.org/10.1117/12.853819

KEYWORDS: Sensors, Microelectromechanical systems, Inspection, Calibration, Confocal microscopy, Image segmentation, Image processing, Pollution, Microscopes, Microlens array

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Proceedings Article | 17 June 2009 Paper

Sensor and actuator conditioning for multiscale measurement systems on example of confocal microscopy

W. Lyda, J. Zimmermann, A. Burla, J. Regin, W. Osten, O. Sawodny, E. Westkämper

Proceedings Volume 7389, 738903 (2009) https://doi.org/10.1117/12.827534

KEYWORDS: Confocal microscopy, Sensors, Actuators, Microscopes, Microlens, Microlens array, Control systems, Systems modeling, Error analysis, Mirrors

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Proceedings Article | 18 August 2005 Paper

Fast hologram computation and aberration control for holographic tweezers

M. Reicherter, T. Haist, S. Zwick, A. Burla, L. Seifert, W. Osten

Proceedings Volume 5930, 59301Y (2005) https://doi.org/10.1117/12.617040

KEYWORDS: Holograms, Holography, LCDs, Visualization, Particles, Spatial light modulators, Optical tweezers, Semiconductor lasers, Phase contrast, Modulators

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Showing 5 of 10 publications

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