Prof. Bennett B. Goldberg
Professor/Assistant Provost at Northwestern Univ
SPIE Involvement:
Author | Instructor
Publications (8)

Proceedings Article | 21 February 2017 Presentation + Paper
Proceedings Volume 10073, 100730E (2017) https://doi.org/10.1117/12.2271502
KEYWORDS: Microscopes, Microscopy, Optical transfer functions, Cameras, Luminescence, Deformable mirrors, Deconvolution, Brain, Tissues, Air contamination

Proceedings Article | 4 October 2007 Paper
Proceedings Volume 6759, 675904 (2007) https://doi.org/10.1117/12.733203
KEYWORDS: Fourier transforms, Mirrors, Interferometers, Signal to noise ratio, Spectroscopy, Luminescence, Microscopy, Reflectance spectroscopy, CCD cameras, Biomedical optics

Proceedings Article | 24 March 2005 Paper
Proceedings Volume 5701, (2005) https://doi.org/10.1117/12.590640
KEYWORDS: Confocal microscopy, Image acquisition, Point spread functions, Optical transfer functions, Microscopes, Image processing, Signal to noise ratio, Sensors, Microscopy, Charge-coupled devices

Proceedings Article | 13 July 2004 Paper
Brynmor Davis, William Karl, Anna Swan, Bennett Goldberg, M. Selim Unlu, Marcia Goldberg
Proceedings Volume 5324, (2004) https://doi.org/10.1117/12.527800
KEYWORDS: Point spread functions, Microscopy, Reconstruction algorithms, Luminescence, Confocal microscopy, Deconvolution, Algorithm development, Image resolution, Image processing, Data modeling

Proceedings Article | 1 June 2004 Paper
Proceedings Volume 5331, (2004) https://doi.org/10.1117/12.530441
KEYWORDS: Oxides, Molecules, Mirrors, Luminescence, Fluorescent markers, Silicon, Microscopes, Optical testing, Microscopy, Sensors

Showing 5 of 8 publications
Course Instructor
SC440: Ultra-Resolution Optical Microscopy
This is a one-day lecture in the theory, development, and applications of high-resolution optical microscopy with a concentration on solid immersion lens and near-field scanning optical microscopy techniques. The course covers the necessary general background to optics and microscopy near the diffraction limit. Subjects covered include the development of scanned probe microscopies; the development and theory of near-field scanning optical microscopy; the design, construction, and assessment of near-field microscopes; the application of near-field microscopy to biological systems, to waveguides and photonic devices, and to semiconductor characterization; the theory, development, and practical application of solid immersion microscopy, including semiconductor inspection and thermal imaging.
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