Keypoint detection is a crucial step in feature-based image registration methods. Traditional approaches typically rely on corner or blob matching. In this paper, we address the registration problem of optical and synthetic aperture radar (SAR) images by proposing the use of phase consistency maps combined with maximum moment maps for image enhancement. We then perform joint detection of multi-scale corners and blobs, followed by subsequent processing, in order to improve the repeatability and spatial distribution of the detected key points. By combining these two types of keypoints in the proposed method, we can benefit from the complementary strengths of corner and blob detection. This approach allows us to capture a wider range of salient image features and improve the robustness and accuracy of keypoint detection.
Achieving high-quality output if large-scale SAR image stitching demands color balancing of the images to be stitched. However, adjacent SAR images may exhibit large differences in radiation intensity, particularly in the context of different-track SAR images. Furthermore, the diverse sizes and uneven spatial distribution of SAR images from different sources pose a challenge for color balancing in image stitching. To alleviate these issues, we propose a large-scale multi-track spaceborne SAR image dodging stitching scheme based on the working characteristics of spaceborne SAR. We leverage different algorithms for along-track and across-track SAR image dodging, based on the statistical characteristics of the overlap region and block processing, to ensure uniform luminance and contrast in the color-balanced stitched images. We introduce an evaluation metric to assess the extent of contrast preservation between the images before and after dodging. In our experiments, we utilize 116 Gaofen-3 and Sentinel-1 SAR images for dodging stitching and compare our proposed method to traditional dodging methods. The proposed method outperforms traditional methods both in terms of visual effects and evaluation metrics.
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