Chao-Yuan Wu
at National Central Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 August 2009 Paper
Proceedings Volume 7409, 74090S (2009) https://doi.org/10.1117/12.825815
KEYWORDS: Thin films, Refractive index, Interferometers, Reflection, Phase shifts, Cameras, Polarizers, Coating, Light sources, Bandpass filters

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