A high precision contact probe for a micro/nano-CMM was developed to detect the 3D motion of the stylus tip. This contact probe is composed of a stylus with a ball tip, a suspension plate and three displacement sensors. The stylus was connected to the suspension plate, which is suspended to the probe housing by three beryllium-copper leaf springs. A 3D translation of a ball tip causing by probing force would be transferred to three Z-displacements on the suspension plate. Displacement sensors, based on the classic model of Michelson interferometer, can measure nanoscale displacement on the plate. Calibrations with a nano measuring and positioning machine (NMM) proved the typical standard deviation was less than 20 nm for both the trigger and scanning modes.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.