Dr. Christopher E. Fink
Chief Technical Officer at JRM Technologies Inc
SPIE Involvement:
Author
Area of Expertise:
thermal physics , reflection physics , atmospheric physics , signature simulation
Websites:
Publications (4)

Proceedings Article | 3 May 2016 Paper
Proceedings Volume 9820, 98201B (2016) https://doi.org/10.1117/12.2235500
KEYWORDS: Sensors, Infrared sensors, Staring arrays, Electronics, Projection systems, Cameras, Image sensors, Calibration, Mid-IR, Modulation transfer functions

Proceedings Article | 25 May 2005 Paper
Christopher Fink, Joseph Moulton, Michael Ortalano, Richard Speer, Ray Kaplan, John Helmsen, Raymond Haren, Steven Sawtelle
Proceedings Volume 5811, (2005) https://doi.org/10.1117/12.603147
KEYWORDS: Atmospheric modeling, Thermal modeling, Databases, 3D modeling, Chemical elements, Light sources, Bidirectional reflectance transmission function, Data modeling, Solids, Reflectivity

Proceedings Article | 5 August 2004 Paper
Christopher Fink, Joseph Moulton, Michael Ortalano, John Helmsen, Alexander Soiguine, Raymond Kaplan, William Seng, Raymond Haren
Proceedings Volume 5431, (2004) https://doi.org/10.1117/12.542488
KEYWORDS: Atmospheric modeling, Databases, Reflection, 3D modeling, Geographic information systems, Bidirectional reflectance transmission function, Computer programming, RGB color model, Chemical elements, Solids

Proceedings Article | 6 August 2002 Paper
Proceedings Volume 4718, (2002) https://doi.org/10.1117/12.478828
KEYWORDS: Sensors, Data modeling, Atmospheric modeling, 3D modeling, Bidirectional reflectance transmission function, Reflectivity, Scene simulation, Thermal modeling, Detection and tracking algorithms, Computer simulations

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