Dr. Cinti X. Chen
at Advanced Micro Devices Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 3 April 2010 Paper
Cinti Chen, Joe Zhao, Ping Zhang, Raymond Xu
Proceedings Volume 7641, 76410C (2010) https://doi.org/10.1117/12.848185
KEYWORDS: Field programmable gate arrays, Semiconducting wafers, Defect inspection, Yield improvement, Inspection, Metals, Scanning electron microscopy, Optical proximity correction, Semiconductors, Overlay metrology

Proceedings Article | 30 July 2002 Paper
Proceedings Volume 4691, (2002) https://doi.org/10.1117/12.474598
KEYWORDS: Modulation transfer functions, Point spread functions, Spatial frequencies, Photomasks, Scanners, Modulation, Lithography, Light scattering, Semiconducting wafers, Critical dimension metrology

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