The star sensor is an important means of satellite on-orbit attitude measurement, and its angle measurement accuracy directly determines the satellite attitude measurement accuracy. The optical system is an important part of the star sensor, and its image quality evaluation method, aberration control and optimization design method are different from the traditional imaging system. Starting from the working principle of the star sensor, this paper analyzes the main factors that affect the accuracy of angle measurement and the imaging characteristics of the energy detection system, and then puts forward the control elements and aberration correction requirements at the lens design level, and finally discusses the difference from the Programming language Method, using various operands provided by optical design software to constrain various aberration. Finally, for an optical system with a focal length of 250mm, an entrance diameter of 125mm, a field of view of 8°, and a spectral range of 400nm to 800nm, the constraint method proposed in this paper is used to optimize the design at the system level, and the finally imaging quality meets the shape of spot, centroid position deviation, enclosed energy, relative distortion, lateral chromatic aberration and other special requirements, and in the temperature range -10℃~40℃, the imaging quality is almost unchanged. The simulation results show that the optimized control method proposed in this paper has important guiding significance for the optical design of the very high-precision star sensor, and it is also suitable for energy detection systems such a point target detection system.
The EMVA1288 Standard is mostly used for testing and selecting area array and line array image sensors. Nowadays, Time-Delay-Integration (TDI) image sensor, especially novel type TDI-CMOS, will be widely applied in high-quality and low noise imaging domain. The purpose of this paper is to give analysis and improving the test of photo-electricity parameters of TDI image sensor. TDI image sensor has its particular architecture, so it is provided with some unique parameters, such as charge transfer efficiency (CTE). Therefore it is significant to research the improving evaluation method of EMVA1288 Standard. According to the TDI mode, modeling of TDI pixel based on linear model and noise model is achieved. Then researching and finding the improved methods to test CTE and system gain. The measured results of a device are given. The application of evaluation method in this paper is helpful in the process of developing and selecting TDI image sensor.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.