Mr. E. James Egerton Profile

E. James Egerton

President

SPIE Involvement:

Author

Publications (14)

Proceedings Article | 15 October 2012 Paper

Design and development of carbon nanotube and graphene based microbolometer for IR imaging applications

Ashok Sood, E. Egerton, Yash Puri, Neil Goldsman, Xi Shao, Akin Akturk, Nibir Dhar, Madan Dubey, Priyalal Wijewarnasuriya, Bobby Lineberry

Proceedings Volume 8512, 851205 (2012) https://doi.org/10.1117/12.974241

KEYWORDS: Bolometers, Graphene, Resistance, Microbolometers, Infrared radiation, Carbon nanotubes, Infrared bolometers, Infrared imaging, Sensors, Mid-IR

Read Abstract +

Proceedings Article | 31 May 2012 Paper

Design and development of carbon nanotube-based microbolometer for IR imaging applications

Ashok Sood, E. James Egerton, Yash Puri, Gustavo Fernandes, Jimmy Xu, Akin Akturk, Neil Goldsman, Nibir Dhar, Madan Dubey, Priyalal Wijewarnasuriya, Bobby Lineberry

Proceedings Volume 8353, 83533A (2012) https://doi.org/10.1117/12.923020

KEYWORDS: Resistance, Bolometers, Microbolometers, Nanostructures, Carbon, Thermography, Infrared radiation, Capacitance, Carbon nanotubes, Infrared imaging

Read Abstract +

Proceedings Article | 17 September 2011 Paper

Carbon nanotube based microbolometer development for IR imager and sensor applications

Ashok Sood, E. James Egerton, Yash Puri, Gustavo Fernandes, Jin Ho Kim, Jimmy Xu, Neil Goldsman, Nibir Dhar, Priyalal Wijewarnasuriya, Bobby Lineberry

Proceedings Volume 8155, 815513 (2011) https://doi.org/10.1117/12.895277

KEYWORDS: Resistance, Bolometers, Infrared sensors, Nanostructures, Sensors, Carbon nanotubes, Infrared radiation, Thermography, Imaging systems, Image sensors

Read Abstract +

Proceedings Article | 16 September 2011 Paper

Avalanche photodiodes for high-resolution UV imaging applications

Ashok Sood, Robert Richwine, E. James Egerton, Yash Puri, Russell Dupuis, Nibir Dhar, Raymond Balcerak

Proceedings Volume 8155, 815509 (2011) https://doi.org/10.1117/12.895288

KEYWORDS: Ultraviolet radiation, Avalanche photodetectors, Signal to noise ratio, Pulsed laser operation, Interference (communication), Sensors, Target detection, Image resolution, Gallium nitride, Electrons

Read Abstract +

Proceedings Article | 24 May 2011 Paper

Nanostructure-based EO/IR focal plane array development for unattended ground sensor applications

Ashok Sood, E. James Egerton, Robert Richwine, Yash Puri, Tariq Manzur, Nibir Dhar, Dennis Polla, Zhong L. Wang, Gustavo Fernandes, Jimmy Xu, Priyalal Wijewarnasuriya, A. F. M. Anwar

Proceedings Volume 8046, 80460N (2011) https://doi.org/10.1117/12.888125

KEYWORDS: Zinc oxide, Sensors, Ultraviolet radiation, Signal to noise ratio, Nanostructures, Unattended ground sensors, Staring arrays, Interference (communication), Solar energy, Nanowires

Read Abstract +

Proceedings Article | 11 March 2011 Paper

Growth and characterization of ZnO nanostructures for UV sensor applications

Ashok Sood, E. James Egerton, Yash Puri, John Zeller, Tariq Manzur, Dennis Polla, Nibir Dhar, Jun Zhou, Sheng Xu, Su Zhang, Zhong Wang, A. F. Mehdi Anwar

Proceedings Volume 7940, 79400Z (2011) https://doi.org/10.1117/12.882583

KEYWORDS: Zinc oxide, Ultraviolet radiation, Nanostructures, Silicon, Atmospheric modeling, Sensors, Ultraviolet detectors, Solar radiation models, Gold, Nanowires

Read Abstract +

Proceedings Article | 11 February 2011 Paper

Nanostructre based antireflection coatings for EO/IR sensor applications

Ashok Sood, Roger Welser, Adam Sood, E. James Egerton, Yash Puri, David Poxson, Sammer Chhajed Jaehee Cho, E. Fred Schubert, Dennis Polla, Nibir Dhar, Raymond Balcerak, Martin Soprano

Proceedings Volume 7954, 79540W (2011) https://doi.org/10.1117/12.882535

KEYWORDS: Antireflective coatings, Sensors, Silica, Reflectivity, Ultraviolet radiation, Near infrared, Refractive index, Visible radiation, Nanowires, Nanorods

Read Abstract +

Proceedings Article | 2 October 2006 Paper

Design and development of high quantum efficiency large area UV focal plane arrays for photon counting applications

E. Egerton, Ashok Sood, Robert Bell, Yash Puri, Jacob Roginsky, Melville Ulmer, Bruce Wessels, Timothy Cook

Proceedings Volume 6389, 63890R (2006) https://doi.org/10.1117/12.692774

KEYWORDS: Silicon, Gallium nitride, Ultraviolet radiation, Etching, Staring arrays, Microchannel plates, Photon counting, Sensors, Quantum efficiency, Ions

Read Abstract +

Proceedings Article | 7 September 2006 Paper

Design considerations of ROIC for single color LWIR and multicolor IR focal plane arrays

Ashok Sood, James Egerton, Yash Puri, Latika Becker, Timothy Cook, Fouad Kiamilev

Proceedings Volume 6294, 62940A (2006) https://doi.org/10.1117/12.684641

KEYWORDS: Readout integrated circuits, Sensors, Staring arrays, Mercury cadmium telluride, Long wavelength infrared, Amplifiers, Silicon, Photodiodes, CMOS sensors, Interference (communication)

Read Abstract +

Proceedings Article | 22 October 2004 Paper

Design and development of high-performance radiation-hardened antireflection coatings for LWIR HgCdTe focal plane arrays

Ashok Sood, E. James Egerton, Sriraj Bhadra, Yash Puri, Gregory Brill, Priyalal Wijewarnasuriya, Yuanping Chan, Nibir Dhar, Meimei Tidrow, Dave Christian, Paul LoVecchio

Proceedings Volume 5564, (2004) https://doi.org/10.1117/12.565138

KEYWORDS: Silicon, Antireflective coatings, Long wavelength infrared, Mercury cadmium telluride, Silicon films, Staring arrays, Diamond, Thin film coatings, Thin films, Detector arrays

Read Abstract +

Proceedings Article | 22 October 2004 Paper

Design and development of multicolor detector arrays

Ashok Sood, E. James Egerton, Yash Puri, Enrico Bellotti, Latika Becker, Raymond Balcerak, Siva Sivananthan

Proceedings Volume 5564, (2004) https://doi.org/10.1117/12.565140

KEYWORDS: Mercury cadmium telluride, Sensors, 3D modeling, Staring arrays, Arsenic, Chemical elements, Instrument modeling, Mercury, Detector arrays, Infrared detectors

Read Abstract +

Multi-color infrared (IR) focal planes are required for high performance sensor applications. These sensors will require multi-color focal plane arrays (FPA) that will cover various wavelengths of interest in MWIR/LWIR and LWIR/VLWIR bands. There has been a significant progress in HgCdTe detector technology for multi-color MWIR/LWIR and LWIR/VLWIR focal plane arrays [1,2,3]. Two-color IR FPA eliminate the complexity of multiple single-color IR FPAs and provide a significant reduction of weight and power in a simpler, reliable and affordable systems. The complexity of multicolor IR detector MWIR/LWIR makes the device optimization by trial and error not only impractical but also merely impossible. Too many different geometrical and physical variables need to be considered at the same time. Additionally material characteristics are only relatively controllable and depend on the process repeatability. In this context the ability of performing simulation experiments where only one or a few parameters are carefully controlled is paramount for a quantum improvement of a new generation of multicolor detectors for various applications. Complex multi-color detector pixels cannot be designed and optimized by using a conventional 1D models. Several additional physical phenomena need to be taken into account. In designing a conventional photovoltaic IR detector array, a trade off exists on the choice of the pixel pitch, the pixel area and its height. The main goal of the device optimization is to reduce the pixel cross talk while keeping a high filling factor and detection efficiency. If the pixel height is made comparable to the lateral pixel dimension the contribution of the lateral photocurrent and lateral generation-recombination current becomes relevant and a full 2D simulation needs to be performed. It also important to point out that the few attempts to perform 2D simulations have reached the conclusion that for advanced IR arrays a full 3D approach should be used. The most challenging aspect of the array design and simulation is the pixel cross-talk effects. Since this is caused by the interaction with the four nearest neighboring pixels, even a description based on a 2D simulation model in most cases is not adequate. It is consequently important to include results from 3D simulation models as a guide to build lower dimensionality models.

Proceedings Article | 20 October 2004 Paper

Development of high-performance AlGaN/GaN high-electron mobility transistors for RF applications

Ashok Sood, Elwood Egerton, Yash Puri, Frederick Clarke, James Hwang, Amir Dabiran, Peter Chow, Tom Anderson, Avi Gupta, Andy Souzis, Ilya Zwieback

Proceedings Volume 5550, (2004) https://doi.org/10.1117/12.561584

KEYWORDS: Field effect transistors, Silicon carbide, Gallium nitride, Crystals, Semiconducting wafers, Transistors, Silicon, Doping, Gallium arsenide, Amplifiers

Read Abstract +

Proceedings Article | 18 October 2001 Paper

Twelve key trends in optical communications component and system testing

Michael Minneman, James Egerton, Michael Crawford, Steve Cason

Proceedings Volume 4582, (2001) https://doi.org/10.1117/12.445093

KEYWORDS: Polarization, Optical testing, Optical components, Dense wavelength division multiplexing, Optical communications, Telecommunications, Dispersion, Optical power meters, Optical testing equipment, Receivers

Read Abstract +

Proceedings Article | 1 November 1990 Paper

Automation of IRFPA production processes

James Egerton, Nancy Dieselman, William Higgins, Peter Zimmermann, Ashok Sood

Proceedings Volume 1339, (1990) https://doi.org/10.1117/12.23026

KEYWORDS: Manufacturing, Staring arrays, Sensors, Liquid phase epitaxy, Mercury cadmium telluride, Silicon, Infrared radiation, Wafer manufacturing, Control systems, Process control

Read Abstract +

Showing 5 of 14 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years