Ms. Emily A. Donahue Profile

Emily A. Donahue

at Sandia National Labs

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 20 August 2020 Presentation + Paper

Automatic detection of defects in high reliability as-built parts using x-ray CT

Kevin Potter, Brendan Donohoe, Benjamin Greene, Abigail Pribisova, Emily Donahue

Proceedings Volume 11511, 115110O (2020) https://doi.org/10.1117/12.2570459

KEYWORDS: Computer programming, Computed tomography, 3D image processing, Optical coherence tomography, Machine learning, Defect detection, Computer vision technology

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Proceedings Article | 6 September 2019 Presentation + Paper

Deep learning for automated defect detection in high-reliability electronic parts

Emily Donahue, Tu-Thach Quach, Kevin Potter, Cari Martinez, Matthew Smith, Christian Turner

Proceedings Volume 11139, 1113907 (2019) https://doi.org/10.1117/12.2529584

KEYWORDS: Computed tomography, Transformers, X-rays, Visualization, Defect detection, X-ray imaging, X-ray computed tomography, Neural networks, Machine learning

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Conference Committee Involvement (1)

Applications of Machine Learning 2020

23 August 2020 | Online Only, California, United States

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