Dr. Eric P. Goodwin Profile

Dr. Eric P. Goodwin

Director, Optical Sciences

SPIE Involvement:

Editorial Board Member: Journal of Micro/Nanopatterning, Materials, and Metrology | Author

Publications (5)

Proceedings Article | 15 May 2024 Paper

Heterodyne lateral shearing interferometer for measuring the form and mid-spatial frequency of aspheric test surfaces

Eric Goodwin, Goldie Goldstein, Kei Itoh, Atsushi Kagiwada, Toyama Kiyoshi

Proceedings Volume 12798, 127982P (2024) https://doi.org/10.1117/12.2692550

KEYWORDS: Shearing interferometers, Heterodyning, Aspheric lenses

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Proceedings Article | 5 September 2014 Paper

Interferometry and ophthalmics at the College of Optical Sciences

John Greivenkamp, Gregory Williby, Eric Goodwin, Brian Primeau, Kyle Heideman, Jason Micali, Russell Spaulding

Proceedings Volume 9186, 91860W (2014) https://doi.org/10.1117/12.2064333

KEYWORDS: Interferometers, Contact lenses, Wavefronts, Cameras, Interfaces, Interferometry, Eye, Fluid dynamics, Refractive index, Refraction

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SPIE Press Book | 28 September 2006

Field Guide to Interferometric Optical Testing

Eric Goodwin, James Wyant

KEYWORDS: Interferometry, Interferometers, Optical testing, Wavefronts, Phase shifts, Diffraction gratings, Aspheric lenses, Prisms

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Field Guide to Interferometric Optical Testing

Proceedings Article | 26 February 2004 Paper

Calibration issues with Shack-Hartmann sensors for metrology applications

John Greivenkamp, Daniel Smith, Eric Goodwin

Proceedings Volume 5252, (2004) https://doi.org/10.1117/12.513462

KEYWORDS: Wavefront sensors, Wavefronts, Calibration, Metrology, Sensors, Aspheric lenses, Imaging systems, Optical testing, Interferometry, Spatial resolution

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Proceedings Article | 22 December 2003 Paper

Important considerations when using the Shack-Hartmann method for testing highly aspheric optics

Daniel Smith, Eric Goodwin, John Greivenkamp

Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.505884

KEYWORDS: Wavefronts, Wavefront sensors, Imaging systems, Sensors, Aspheric metrology, Optical testing, Aspheric lenses, Detector arrays, Aspheric optics, Calibration

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