Mr. Ewald Wachmann Profile

Ewald Wachmann

at ams-OSRAM AG

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 22 May 2013 Paper

Characterization of spectral optical responsivity of Si-photodiode junction combinations available in a 0.35µm HV-CMOS technology

A. Kraxner, E. Wachmann, I. Jonak-Auer, J. Teva, J. M. Park, R. Minixhofer

Proceedings Volume 8767, 87670P (2013) https://doi.org/10.1117/12.2017540

KEYWORDS: Doping, Diffusion, Photodiodes, Quantum efficiency, Diodes, Standards development, Optical filters, Silicon, Surface plasmons, CMOS technology

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Proceedings Article | 12 May 2012 Paper

New integration concept of PIN photodiodes in 0.35um CMOS technologies

I. Jonak-Auer, J. Teva, J. M. Park, S. Jessenig, M. Rohrbacher, E. Wachmann

Proceedings Volume 8431, 843115 (2012) https://doi.org/10.1117/12.922268

KEYWORDS: Photodiodes, Doping, PIN photodiodes, Capacitance, Silicon, Semiconducting wafers, Deposition processes, Surface plasmons, Sensors, Logic

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Proceedings Article | 9 May 2011 Paper

Dark current study for CMOS fully integrated-PIN-photodiodes

Jordi Teva, Stefan Jessenig, Ingrid Jonak-Auer, Franz Schrank, Ewald Wachmann

Proceedings Volume 8073, 80731P (2011) https://doi.org/10.1117/12.886985

KEYWORDS: Diffusion, Photodiodes, PIN photodiodes, Silicon, Doping, Data modeling, Modeling, Temperature metrology, Diodes, Transistors

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Proceedings Article | 18 May 2010 Paper

HELIOS: photonics electronics functional integration on CMOS

Jean-Marc Fédéli, Laurent Fulbert, Dries Van Thourhout, Pierre Viktorovitch, Ian O'Connor, Guang-Hua Duan, Graham Reed, Francesco Della Corte, Laurent Vivien, Francisco Lopez Royo, Lorenzo Pavesi, Blas Garrido, Emmanuel Grard, Bernd Tillack, Lars Zimmermann, Stéphane Formont, Andreas Hakansson, Ewald Wachmann, Horst Zimmermann, Arjen Bakker, Henri Porte

Proceedings Volume 7719, 771907 (2010) https://doi.org/10.1117/12.853957

KEYWORDS: Photonics, Silicon, Waveguides, Electronics, Semiconducting wafers, Silicon photonics, Microelectronics, Modulators, Germanium, Polarization

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Proceedings Article | 18 May 2010 Paper

PIN photodiodes with significantly improved responsivities implemented in a 0.35µm CMOS/BiCMOS technology

I. Jonak-Auer, A. Marchlewski, S. Jessenig, A. Polzer, W. Gaberl, A. Schmiderer, E. Wachmann, H. Zimmermann

Proceedings Volume 7719, 77190U (2010) https://doi.org/10.1117/12.853703

KEYWORDS: Photodiodes, PIN photodiodes, Silicon, Dielectrics, Etching, Photomasks, Photodetectors, Transmittance, CMOS technology, Optical testing

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Proceedings Article | 16 February 2010 Paper

Gathering effect on dark current for CMOS fully integrated-, PIN-photodiodes

Jordi Teva, Ingrid Jonak-Auer, Franz Schrank, Jochen Kraft, Joerg Siegert, Ewald Wachmann

Proceedings Volume 7605, 76050A (2010) https://doi.org/10.1117/12.842231

KEYWORDS: Photodiodes, Diffusion, PIN photodiodes, Transistors, Silicon, Temperature metrology, Doping, Semiconductors, Semiconducting wafers, Data modeling

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Proceedings Article | 18 February 2009 Paper

Universal PIN photodiodes in a 0.35µm BiCMOS mixed-signal ASIC technology

Artur Marchlewski, Gerald Meinhardt, Ingrid Jonak-Auer, Verena Vescoli, Ewald Wachmann, Kerstin Schneider-Hornstein, Horst Zimmermann

Proceedings Volume 7220, 72200C (2009) https://doi.org/10.1117/12.808944

KEYWORDS: Photodiodes, PIN photodiodes, Capacitance, Semiconducting wafers, Photodetectors, Sensors, Diffusion, Doping, Palladium, Wafer-level optics

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Showing 5 of 7 publications

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