Mr. Fabien Schmutz Profile

Fabien Schmutz

at Technische Univ Delft

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Author

Publications (4)

Proceedings Article | 23 August 2024 Poster + Paper

Laboratory spectroscopic ellipsometer for bidirectional reflectance of planetary surfaces

Adyn Miles, Sandra Potin, Jérôme Loicq, Pierre Piron, Fabien Schmutz

Proceedings Volume 13092, 130927G (2024) https://doi.org/10.1117/12.3018890

KEYWORDS: Equipment, Polarization, Reflectivity, Polarimetry, Light sources and illumination, Signal to noise ratio, Reflection, Spectral resolution, Absorption, Spectroscopes

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Proceedings Article | 23 August 2024 Poster + Paper

Experimental validation of a full Stokes spectropolarimeter for space applications

Bogdan Vasilescu, Pierre Piron, Fabien Schmutz, Ralph Snel, Eugenio Di Iorio, Mireille Ouellet, Quentin Chavet, Ivan Ferrario, Jérôme Loicq

Proceedings Volume 13092, 130922W (2024) https://doi.org/10.1117/12.3018645

KEYWORDS: Polarization, Matrices, Modulators, Equipment, Linear polarizers, Demodulation, Spectropolarimetry, Modulation, Prisms

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Proceedings Article | 12 July 2023 Open Access

Multi-Viewing, Multi-Channel, Multi-Polarisation, Imaging (3MI) Proto Flight Model (PFM) On-Ground calibration

C. Michel, L. Clermont, N. Daddi, F. La China, I. Fuentes, E. Mazy, M. Porciani, F. Schmutz, Y. Stockman, Y. Zhao

Proceedings Volume 12777, 127771H (2023) https://doi.org/10.1117/12.2689290

KEYWORDS: Calibration, Short wave infrared radiation, Equipment, Cameras, Modulation transfer functions, Tunable filters, Astronomical imaging, Stray light, Polarization, Optical filters

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Proceedings Article | 29 August 2022 Presentation + Paper

Multi-directional, multi-polarization, multi-spectral imager (3MI) engineering model (EM) on-ground calibration

C. Michel, L. Clermont, N. Daddi, F. La China, S. Marcotte, E. Mazy, M. Porciani, F. Schmutz, Y. Stockman

Proceedings Volume 12188, 121881I (2022) https://doi.org/10.1117/12.2628346

KEYWORDS: Calibration, Modulation transfer functions, Collimators, Short wave infrared radiation, Integrating spheres, Cameras, Polarization, Optical fibers, Optical benches, Instrument modeling

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