Fernand Vermeersch
at SCK-CEN
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 February 1997 Paper
Filip Vanhavere, Fernand Vermeersch, P. Cuynen
Proceedings Volume 2867, (1997) https://doi.org/10.1117/12.267924
KEYWORDS: Calibration, Sensors, Scattering, Monte Carlo methods, Radon, Measurement devices, Data corrections, Solids, Iron, Data modeling

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