An envelope ADI-FDTD technique is proposed and developed based on recently published ADI-FDTD method. Compared with FDTD and ADI-FDTD, the proposed method significantly reduces the computation time while retaining reasonable accuracy. Perfectly Matched Layer (PML) boundary condition is successfully used in conjunction with the envelope ADI-FDTD. Demonstrations of the method are performed on various high index contrast structures including 90-degree waveguide bends, air-hole photonic band-gap structures and microdisk resonators.
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