KEYWORDS: Charge-coupled devices, Clocks, CCD image sensors, Device simulation, Telescopes, Video, Analog electronics, Field programmable gate arrays, Analog to digital converters, Amplifiers
In this paper, we design a simulation test system to test the readout and drive circuit of the Front-End electronics board (FEB) of the CCD detector system of Wide Field Survey Telescope (WFST). For fast and accurate testing, the CCD simulation test system can c 20-channel clock detection, 16-channel bias, and 16-channel bias noise detection. In addition, the simulation test system can also provide two channels of analog CCD waveform output for testing FEB waveform sampling circuits. The analog CCD waveform output module consists of a digital waveform output module and an analog waveform output module, which can be selected according to specific requirements. The simulation test system has been used to test the FEB performance of the Wide Field Survey Telescope.
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