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John J. Nemechek
President at Metrology Concepts LLC
SPIE Involvement:
Author
Publications (4)
Proceedings Article | 12 October 2015 Paper
Optical measurement of materials and lens assemblies at specific or varied temperatures
Proceedings Volume 9633, 96331S (2015) https://doi.org/10.1117/12.2197598
KEYWORDS: Wavefronts, Temperature metrology, Unmanned aerial vehicles, Photovoltaics, Wavefront sensors, Optical testing, Interferometry, Aluminum, Sensors, Objectives
Proceedings Article | 2 May 2005 Paper
Mechanical errors related to interferometric radius of curvature measurements
Patrick McGhee, John Nemechek
Proceedings Volume 10315, 1031519 (2005) https://doi.org/10.1117/12.605853
KEYWORDS: Interferometry, Interferometers, Eye, Confocal microscopy, Environmental sensing
Proceedings Article | 1 September 1998 Paper
New flatness measurement instrument for 230-mm lapped and polished photomasks
Paul Dewa, Andrew Kulawiec, Stephen Mack, John Nemechek
Proceedings Volume 3412, (1998) https://doi.org/10.1117/12.328803
KEYWORDS: Photomasks, Surface finishing, Polishing, Interferometers, Interferometry, Prisms, Reflection, Process control, Beam splitters, Optical design
Proceedings Article | 25 November 1993 Paper
Design and construction of large-aperture reflective interferometers
Proceedings Volume 2000, (1993) https://doi.org/10.1117/12.163635
KEYWORDS: Mirrors, Interferometers, Beam splitters, Lenses, Spherical lenses, Reflectivity, Wavefronts, Monochromatic aberrations, Optical components, Combined lens-mirror systems
Conference Committee Involvement (13)
Optifab 2023
16 October 2023 | Rochester, New York, United States
Optifab 2021
18 October 2021 | Rochester, New York, United States
Optifab 2019
14 October 2019 | Rochester, New York, United States
Optifab 2017
16 October 2017 | Rochester, New York, United States
Optifab 2015
12 October 2015 | Rochester, New York, United States
Showing 5 of 13 Conference Committees
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