Jong Hoon Kim
at SK Hynix Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 21 May 2011 Paper
Proceedings Volume 8012, 80121P (2011) https://doi.org/10.1117/12.886913
KEYWORDS: Nickel, Oxides, Oxygen, Microbolometers, Heat treatments, Metals, Resistance, Sputter deposition, Amorphous silicon, Oxidation

Proceedings Article | 13 March 2006 Paper
Woo-Yung Jung, Choi-Dong Kim, Jae-Doo Eom, Sung-Yoon Cho, Sung-Min Jeon, Jong-Hoon Kim, Jae-In Moon, Byung-Seok Lee, Sung-Ki Park
Proceedings Volume 6156, 61561J (2006) https://doi.org/10.1117/12.650991
KEYWORDS: Photomasks, Etching, Critical dimension metrology, Lithography, Oxides, Optical lithography, Chemical mechanical planarization, Resolution enhancement technologies, Semiconductors, Reticles

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