Dr. Joong Y. Lee
Engineer at Rochester Institute of Technology
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 10 July 2018 Paper
Proceedings Volume 10709, 1070926 (2018) https://doi.org/10.1117/12.2313401
KEYWORDS: Sensors, Silicon, Mercury cadmium telluride, Semiconducting wafers, Quantum efficiency, Annealing, Infrared sensors, Observational astronomy, Infrared detectors, Short wave infrared radiation

SPIE Journal Paper | 6 July 2016
JATIS, Vol. 2, Issue 03, 036001, (July 2016) https://doi.org/10.1117/12.10.1117/1.JATIS.2.3.036001
KEYWORDS: Silicon, Sensors, Imaging arrays, Tolerancing, Charge-coupled devices, Avalanche photodiodes, Signal to noise ratio, Imaging systems, Electron multiplying charge coupled devices, Solar radiation

Proceedings Article | 28 August 2015 Paper
Proceedings Volume 9609, 96090Y (2015) https://doi.org/10.1117/12.2195991
KEYWORDS: Sensors, Silicon, Mercury cadmium telluride, Semiconducting wafers, Quantum efficiency, Infrared detectors, Infrared radiation, Astronomy, Transmission electron microscopy, Infrared sensors

Proceedings Article | 28 May 2014 Paper
Proceedings Volume 9114, 91140D (2014) https://doi.org/10.1117/12.2050383
KEYWORDS: Sensors, Signal to noise ratio, Charge-coupled devices, CMOS sensors, Low light level imaging, Radiation effects, Sensor performance, Photodetectors, Silicon, Electron multiplying charge coupled devices

Proceedings Article | 16 September 2011 Paper
Proceedings Volume 8155, 81551C (2011) https://doi.org/10.1117/12.898570
KEYWORDS: Sensors, Avalanche photodetectors, Image sensors, Signal to noise ratio, Signal detection, Electrons, Silicon, Charge-coupled devices, Single photon, Photodetectors

Showing 5 of 6 publications
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