Dr. Jürgen Petter
Business Director at AMETEK Germany GmbH
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 11 October 2015 Paper
Proceedings Volume 9633, 96331O (2015) https://doi.org/10.1117/12.2197184
KEYWORDS: Aspheric lenses, 3D metrology, Aspheric optics, Optical testing, Distance measurement, Monochromatic aberrations, Metrology, Sensors, Interferometers, Error analysis

Proceedings Article | 15 October 2013 Paper
Proceedings Volume 8884, 88840V (2013) https://doi.org/10.1117/12.2029238
KEYWORDS: Aspheric lenses, Metrology, Lenses, Interferometers, Optical testing, 3D metrology, Signal detection, Distance measurement, Interferometry, Time metrology

Proceedings Article | 13 May 2013 Paper
Proceedings Volume 8788, 878819 (2013) https://doi.org/10.1117/12.2020572
KEYWORDS: Aspheric lenses, Interferometers, Surface finishing, Lenses, Metrology, Sensors, Profiling, Axicons, Interferometry, Distance measurement

Proceedings Article | 25 April 2008 Paper
Proceedings Volume 6995, 699509 (2008) https://doi.org/10.1117/12.780006
KEYWORDS: Waveguides, Near field scanning optical microscopy, Refractive index, Lithium niobate, Crystals, Integrated optics, Sensors, Interfaces, Coating, Near field

Proceedings Article | 19 November 2003 Paper
Cornelia Denz, J. Petter, D. Trager, Carsten Weilnau
Proceedings Volume 4829, (2003) https://doi.org/10.1117/12.525548
KEYWORDS: Solitons, Waveguides, Crystals, Photonics, Refractive index, Modulation, Laser beam diagnostics, Spatial solitons, Laser crystals, Photonic crystals

Showing 5 of 6 publications
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