Dr. Kenneth L. Blaedel Profile

Dr. Kenneth L. Blaedel

Engineer at Columbia Univ

SPIE Involvement:

Author

Publications (16)

Proceedings Article | 7 October 2011 Paper

NuSTAR ground calibration: The Rainwater Memorial Calibration Facility (RaMCaF)

Nicolai Brejnholt, Finn Christensen, Anders Jakobsen, Charles Hailey, Jason Koglin, Kenneth Blaedel, Marcela Stern, Doug Thornhill, Clio Sleator, Shuo Zhang, William Craig, Kristin Madsen, Todd Decker, Michael Pivovaroff, Julia Vogel

Proceedings Volume 8147, 81470I (2011) https://doi.org/10.1117/12.894659

KEYWORDS: Calibration, X-ray optics, Sensors, Multilayers, X-rays, Optical alignment, Optical coatings, X-ray telescopes, Optical calibration, Floods

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Proceedings Article | 7 October 2011 Paper

Fabrication of the NuSTAR flight optics

William Craig, HongJun An, Kenneth Blaedel, Finn Christensen, Todd Decker, Anne Fabricant, Jeff Gum, Charles Hailey, Layton Hale, Carsten Jensen, Jason Koglin, Kaya Mori, Melanie Nynka, Michael Pivovaroff, Marton Sharpe, Marcela Stern, Gordon Tajiri, William Zhang

Proceedings Volume 8147, 81470H (2011) https://doi.org/10.1117/12.895278

KEYWORDS: Glasses, Optics manufacturing, X-ray optics, Epoxies, X-rays, Thermography, Space telescopes, Optical fabrication, Composites, Coating

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Proceedings Article | 29 July 2010 Paper

The Nuclear Spectroscopic Telescope Array (NuSTAR): optics overview and current status

Charles Hailey, HongJun An, Kenneth Blaedel, Nicolai Brejnholt, Finn Christensen, William Craig, Todd Decker, Melanie Doll, Jeff Gum, Jason Koglin, Carsten Jensen, Layton Hale, Kaya Mori, Michael Pivovaroff, Marton Sharpe, Marcela Stern, Gordon Tajiri, William Zhang

Proceedings Volume 7732, 77320T (2010) https://doi.org/10.1117/12.857654

KEYWORDS: Glasses, X-rays, X-ray optics, Multilayers, Telescopes, Epoxies, Germanium, Process modeling, Metrology, Coating

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Proceedings Article | 31 August 2009 Paper

NuSTAR hard x-ray optics design and performance

Jason Koglin, HongJun An, Kenneth Blaedel, Nicolai Brejnholt, Finn Christensen, William Craig, Todd Decker, Charles Hailey, Layton Hale, Fiona Harrison, Carsten Jensen, Kristin Madsen, Kaya Mori, Michael Pivovaroff, Gordon Tajiri, William Zhang

Proceedings Volume 7437, 74370C (2009) https://doi.org/10.1117/12.826724

KEYWORDS: Mirrors, Multilayers, Sensors, X-rays, Point spread functions, X-ray optics, Hard x-rays, Coating, Glasses, Optical design

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Proceedings Article | 16 June 2003 Paper

EUV mask stress mapping by an experimental and hybrid finite element technique

Zhaohua Feng, Edward Lovell, Roxann Engelstad, Andrew Mikkelson, Phillip Reu, Jaewoong Sohn, Kenneth Blaedel, Andre Claudet

Proceedings Volume 5037, (2003) https://doi.org/10.1117/12.490139

KEYWORDS: Photomasks, Extreme ultraviolet, Multilayers, Reticles, Reflectors, Lithography, Distortion, Extreme ultraviolet lithography, Chromium, Spherical lenses

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Proceedings Article | 16 June 2003 Paper

System and process learning in a full-field high-power EUVL alpha tool

William Ballard, Daniel Tichenor, Donna O'Connell, Luis Bernardez, Robert Lafon, Richard Anderson, Alvin Leung, Kenneth Williams, Steven Haney, Yon Perras, Karen Jefferson, Therese Porter, Daniel Knight, Pamela Barr, James Van de Vreugde, Richard Campiotti, Mark Zimmerman, Terry Johnson, Leonard Klebanoff, Philip Grunow, Samuel Graham, Dean Buchenauer, William Replogle, Tony Smith, John Wronosky, Joel Darnold, Kenneth Blaedel, Henry Chapman, John Taylor, Layton Hale, Gary Sommargren, Eric Gullikson, Patrick Naulleau, Kenneth Goldberg, Sang Hun Lee, Harry Shields, Randall St. Pierre, Samuel Ponti

Proceedings Volume 5037, (2003) https://doi.org/10.1117/12.482791

KEYWORDS: Semiconducting wafers, Reticles, Extreme ultraviolet, Sensors, Extreme ultraviolet lithography, Lithography, Projection systems, Xenon, EUV optics, Fiber optic illuminators

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